Verilog is used to describe the internal architectures of Built-In Self-Test (BIST) and Design for Testability (DFT) . This helps engineers evaluate hardware overhead and timing feasibility, which is critical for System-on-Chip (SoC) designs.
Scan architectures, RT-level scan design, and Boundary Scan (JTAG). Digital System Test and Testable Design: Using ...
The book describes on-chip decompression algorithms in Verilog, providing a realistic look at how these impact overall chip area and performance. Key Technical Coverage Verilog is used to describe the internal architectures
Logic BIST basics, test pattern generation, and output response analysis. RT-level scan design
Gate-level faults, fault collapsing, and structural modeling in Verilog.